- wavelength-dispersive X-ray fluorescence analysis
- рентгенофлуоресцентний аналіз з розділенням за довжиною хвиль
English-Ukrainian analytical chemistry dictionary. 2013.
wavelength-dispersive X-ray fluorescence analysis
Смотреть что такое "wavelength-dispersive X-ray fluorescence analysis" в других словарях:
Wavelength dispersive X-ray spectroscopy — The Wavelength dispersive X ray spectroscopy (WDXRF or WDS) is a method used to count the number of X rays of a specific wavelength diffracted by a crystal. The wavelength of the impinging x ray and the crystal s lattice spacings are related by… … Wikipedia
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
Fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Spectrometrie de fluorescence X — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
Spectrométrie de fluorescence X — Pour les articles homonymes, voir SFX, FX et XRF. Un chimiste manipule un goniomètre manuel pour l analyse par spectrométrie de fluorescence X de monocristaux d échant … Wikipédia en Français
Spectrométrie de fluorescence x — Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann … Wikipedia
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
Characteristic x-ray — A high energy electron interacts with a bound electron in an atom and ejects it. The incident electron is scattered and the target electron gets displaced from its shell. The incident electron energy must exceed the binding energy of the electron … Wikipedia
Multi-wavelength anomalous dispersion — Multi wavelength anomalous diffraction (sometimes Multi wavelength anomalous dispersion; abbreviated MAD) is a technique used in X ray crystallography that facilitates the determination of the three dimensional structure of biological… … Wikipedia
